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TESEQ NSG 3040 Multi-Function Generator System 4 kV Solution

Description

Teseq’s new NSG 3040 is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards. The NSG 3040 system is designed to fulfill conducted EMC test requirements for CE mark testing, including Combination Wave Surge (4.4 kV), Electrical Fast Transient (EFT) pulses (4.8 kV) and Power Quality Testing (PQT). Expansion capabilities enable the system to be configured for a much broader range of applications including Telecom Surge 10/700 and Magnetic Field tests.

Featuring an innovative modular design, the NSG 3040 is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration.

Depending on your exact testing needs, different models are available to ensure the NSG 3040 is configured to your exact testing requirements.

Features

  • Modular, expandable system
  • Surge, EFT/Burst, Power Quality and more
  • Intuitive 7.2” color touch screen interface
  • Expert mode for changing parameters while test is running (diagnostics) 
  • Status LEDs
  • Safety connectors

Specifications

Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5

Parameter

Value

Pulse voltage (open circuit)

±200 V to 4.4 kV (in 1 V steps)

Pulse current (short circuit)

±100 A to 2.2 kA

Impedance

2/12 Ω

Polarity

positive / negative / alternate

Pulse repetition

10 s, up to 600 s (in 1 s steps)

Test duration

1 to 9999 pulses, continuous

Phase synchronization

asynchronous, synchronous 0 to 359º (in 1º steps)

Coupling

external / internal

 Burst (EFT) 5/50 ns

Pulse conforms to IEC/EN 61000-4-4

Parameter

Value

Pulse amplitude

±200 V to 4.8 kV (in 1 V steps) - open circuit
±100 V to 2.4 kV (50 Ω matching system)

Burst frequency

100 Hz to 1000 kHz

Polarity

positive / negative / alternate

Repetition time

1 ms to 4200 s (70 min)

Burst time

1 μs to 1999 s, single pulse, continuous

Test duration

1 s to 1000 h

Phase synchronization

asynchronous, synchronous 0 to 359º (in 1º steps)

Coupling

external / internal

 Dips & drops

Conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29

Parameter

Value

Dips & drops

From EUT voltage input to 0 V, 0%

Uvar with optional variac

depending on model (VAR 650x)

Uvar with step transformer

0, 40, 70, 80% (INA 650x)

Peak inrush current capability

500 A (at 230 V)

Switching times

1 to 5 μs (100 Ω load)

Event time

20 μs to 1999 s, 1 to 99’999 cycles

Test duration

1 s to 70’000 min, 1 to 99’999 events, continuous

Repetition time

40 μs to 35 min, 1 to 99’999 cycles

Phase synchronization

asynchronous, synchronous 0 to 359º (in 1º steps)

Standards

CISPR
CISPR 11
CISPR 14 - 1
CISPR 14 - 2
CISPR 14 - 2
CISPR 16 - 1
CISPR 16 - 2
CISPR 16 - 3
CISPR 16 - 4
CISPR 22
CISPR 24
IEC
IEC/TR EN 61000 - 1 - 1
IEC/TR EN 61000 - 2 - 1
IEC/TR EN 61000 - 2 - 3
IEC EN 61000 - 3 - 2
IEC EN 61000 - 3 - 4
IEC/TC EN 61000 - 3 - 5
IEC EN 61000 - 4 - 2
IEC EN 61000 - 4 - 3
IEC EN 61000 - 4 - 4
IEC EN 61000 - 4 - 5
IEC EN 61000 - 4 - 6
IEC EN 61000 - 4 - 7
IEC EN 61000 - 4 - 8
IEC EN 61000 - 4 - 9
IEC EN 61000 - 4 - 11
European
EN 50 081 part 1
EN 50 081 part 2
EN 55 011
EN 55 013
EN 55 014
EN 55 015
EN 55 020
EN 55 022
EN 55 024
EN 50 082 part 1
EN 50 082 part 2
EN 50 093
American
FCC Part 15
MIL-STD - 461E